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Manual Type
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Manual resistivity, thickness, PN measurement...
EC-80TPN
- Rs : 0.01~3000 ¥Ø/sq
- Res : 0.001~200 ¥Ø¡¤cm
- Thickness : 150~250 ¥ìm 
- Applications : Sili...
Semi-auto Rs measurement system
NC-80M
- Rs : 5.0m¥Ø/sq~1¥Ø/sq (option : up to 20¥Ø/sq)
- Applications : Al or other metal layers on silic...
Non-contact sheet resistance mapping system
NC-300SCAN
- Rs : 0.05~2 ¥Ø/sq
- Applications : Cu film on silicon wafer (silicon wafer t : approx. 750¥ìm)
...
Semi-auto Rs/Res. measurement
NC-80MAP
- Rs : 0.1~3000¥Ø/sq  (Option:1m~1¥Ø/sq)
- Res : 0.001~200¥Ø•cm
- Applications : Silicon w...

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