접촉식 면저항측정기
Manual Type
Semi Auto Type
Full Auto Type
Handy type
비접촉식 면저항측정기
Manual Type
Semi Auto Type
Full Auto Type
In-line Type
Handy type
캐리어 라이프타임측정기
웨이퍼 Flatness / Resistivity
PN판정기
웨이퍼 두께측정기
Manual Type
Semi Auto Type
프로브헤드
확산저항측정기(SRP)
이미지센서 CIS 테스터
표준샘플
장비통합솔루션(측정모듈)
접촉식 면저항
비접촉식 면저항
PN판정
제품별 제품별
Non-contact sheet resistance mapping system
NC-300SCAN
- Rs : 0.05~2 Ω/sq
- Applications : Cu film on silicon wafer (silicon wafer t : approx. 750μm)
                                                          (Cu film thickness : 1000~3000A)
- Sample sizes : up to 8"Ф















 - Single sided eddy current probe(upper side) with air flouting
    - Diameter of probe : 10mm
    - Measuring range : 0.05 ~ 2 ohm/sq (at film thickness : approx.2000A)

 - Performance:
    - Conforms to ASTM F673
    - Measurement repeatability
         CV : less than 0.2% (30 times in stop condition) [CV=STDEVP/AVG×100(%)]

 - Probing stage
   - High speed Y-θaxes motor controlled
         The measurement is performed from the circle of edge to inside, 
         
and the final is the center.
         Tact time : less than 90sec./121 points
   - Mechanical accuracy of stage
         θ-axis : repeatability of positional precision:±0.01°
         Y-axis : repeatability of positional precision:±0.05mm
   - The distance between single side probe and stage:12.5mm