::냅슨코리아(주)::

제품별


	Semi-auto Res/thickness measurement system
	NC-20
	- Rs : 0.01~3,000Ω/sq - Res : 0.001~200Ω·cm - Applications : Silicon wafer, Solar cell (Silicon wafer, Thin film) - Wafer sizes : 3 inch∼8 inch, ∼156mmSQ (Option; 2 inch and/or 12 inch, ∼210 mmSQ)
	- Well suited to silicon wafer of solar cell and/or reclaimed wafers - Eddy current method for resistivity, Electric capacitance method for wafer thickness (NC-22 for Resistivity with conductivity (P/N) check is available) - 1 point measurement of center position - Temperature correction for silicon wafer function