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Semi-auto Res/thickness measurement system
NC-20
- Rs : 0.01~3,000¥Ø/sq
- Res : 0.001~200¥Ø·cm
- Applications : Silicon wafer, Solar cell (Silicon wafer, Thin film)
- Wafer sizes : 3 inch¡­8 inch, ¡­156mmSQ
                      (Option; 2 inch and/or 12 inch, ¡­210 mmSQ)




- Well suited to silicon wafer of solar cell and/or reclaimed wafers

- Eddy current method for resistivity, Electric capacitance method for
  wafer thickness
  (NC-22 for Resistivity with conductivity (P/N) check is available)


- 1 point measurement of center position

- Temperature correction for silicon wafer function