Jandel Engineering Limited
SemiMap Scientific Instruments
Semi-auto Rs/Res. measurement system
- Rs : 5m~10MΩ/sq
- Res : 1m~100kΩ·cm
- Size : Up to 12 inch
Resistivity Reference Wafer
NRW series are resistivity reference wafers which proven by Napson’s resistivity measurement system...
Contactless resistivity mapping measurement s...
COREMA - WT System
Resistivity Mapping, Mobility and Carrier Concentration Measurements for Semi-Insulating SiC, GaAs, ...
Non-contact Rs measurement instrument
- Applications : ITO and Metal layer on glass, other layers
- Size : max. 300x300mm