Napson Corporation
Jandel Engineering Limited
MTI Instruments
Jova Solutions
SemiMap Scientific Instruments
SCI
제조사별 제조사별
TSV측정기
FilmTek™ 2000M TSV
Critical Dimension, Etch Depth, and Film Thickness of TSV Structures
Semi-auto Rs/Res. measurement system
RT-30/RG-3000
- Rs : 5m~10MΩ/sq
- Res : 1m~100kΩ·cm
- Size : Up to 12 inch
Software Tool (Thin Film Design Software)
Film wizard
광학박막설계, 해석용 Software
박막두께측정기 (비접촉, 광학식)
FilmTek™ 1000 Series 외
SCI (Scientific Computing International)

SCI는 1993년 박막분석, 설계 Software 회사로 California에...

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