접촉식 면저항측정기
Manual Type
Semi Auto Type
Full Auto Type
Handy type
비접촉식 면저항측정기
Manual Type
Semi Auto Type
Full Auto Type
In-line Type
Handy type
캐리어 라이프타임측정기
PN판정기
웨이퍼 두께측정기
Manual Type
Semi Auto Type
박막 두께측정기
TSV측정기
프로브헤드
확산저항측정기(SRP)
이미지센서 CIS 테스터
표준샘플
제품별 제품별
Manual resistivity, thickness, PN measurement...
EC-80TPN
- Rs : 0.01~3000 Ω/sq
- Res : 0.001~200 Ω·cm
- Thickness : 150~250 μm 
- Applications : Sili...
Semi-auto Rs measurement system
NC-80M
- Rs : 5.0mΩ/sq~1Ω/sq (option : up to 20Ω/sq)
- Applications : Al or other metal layers on silic...
Non-contact sheet resistance mapping system
NC-300SCAN
- Rs : 0.05~2 Ω/sq
- Applications : Cu film on silicon wafer (silicon wafer t : approx. 750μm)
...
Semi-auto Rs/Res. measurement
NC-80MAP
- Rs : 0.1~3000Ω/sq  (Option:1m~1Ω/sq)
- Res : 0.001~200Ω•cm
- Applications : Silicon w...

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