- Easy operation non-contact resistivity/sheet resistance measuring instrument 

- No damage measurement by non-contact eddy current method

- Small-footprint and data processing by PC 

- Replaceable sensors of Middle and High by meas. Range
  (Option: Low, S/High, Solar cell)

- 1 point measurement of center position

- 5 types of model for each measuring range

- Temperature correction for silicon wafer function

- Thickness measuring instrument of the same type is available with static capacitance probe,  and Thickness range 150μm ~ approx.800μm  (NC-10T)

- Combination tool for resistivity and thickness is available (NC-20)

- Res : Low – 0.001~0.05 Ω·cm                  Rs : Low – 0.01~0.5 Ω/sq
          Middle – 0.05~0.5 Ω·cm                           Middle – 0.5~10 Ω/sq
          High – 0.5~60 Ω·cm                                 High – 10~1000 Ω/sq
          Super High – 60~200 Ω·cm                      Super High – 1000~3000 Ω/sq
          Solar Wafer – 0.2~15 Ω·cm                      Solar - 5~500 Ω/sq