::냅슨코리아(주)::

제품별


	Full Auto wafer sorting system
	NC-6800Ｍ
	- Res : 0.001∼60Ω·cm - Thickness : 150∼800μm - PN : 0.1~1000Ω·cm in resistivity - Applications : Silicon wafer, GaP, nd InP - Wafer sizes : 3"~5"Ф (square samples are available)
	- High precision and high speed wafer resistivity measuring system with non-contact eddy current probes - Max. 300 pieces of wafer are stackable (with non-cassette) on loader and automatically loading to measuring position wih electric static absortion