제조사별 상품리스트

제조사별


	Wafer 두께측정기 (Manual Type)
	Proforma 300i
	- Thickness,TTV & bow, Continuous and 5-point Measurement - Thickness : Up to 1700μm - Applicat...


	Wafer 두께측정기 (Semi Auto Type)
	FLA-200
	-Thickness : 200 –1200μm / Bow : +/-350μm / Warp : 350μm - Applications : Semiconductor ma...


	Non-contact Ultra-High range Rs measurement s...
	CRN-100
	- Rs : 10E+9 ~ 10E+15 Ω/sq - Applications : Any sample within the measurement range can be measur...


	Non-Contact (Pulse-Voltage excitation method)...
	PVE-80
	- Rs : 50u~1mΩ/sq - Applications : Metal films (Ag , Cu , Au , Al or others) - Size : ~W300 x D2...

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