::냅슨코리아(주)::

제품별


	Inline Non-contact Res., PN, thickness and lifetime measurement
	NC-100PV
	- Res : 0.1~15 Ω•cm - Rs : 5~750 Ω/sq - Thickness : 100~500 μm - Applications : Silicon wafer (Mono-crystalline, Poly-crystalline) - Wafer sizes : 126, 156, 210mmSQ (PSQ)
	- In-line on-the-fly measurement module for solar silicon wafer - Possilble to measure Resistivity and/or Thickness by each module without contact - Lifetime measurement module (option) - PN type checker module (option)