- Possible to measure sheet resistance without contact by Max.3types of probes
- Shitable for production line and tranceportation system
- Connect to host PC by LAN to send measurement command and data
Appications
- Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC etc) - New materials, functional materials (Carbon nanotube, DLC, Graphene, Ag nanowire etc) - Conductive thin film (Metal, ITO etc) - Others (Please contact us for details)
Sample size
- 2~8 inch, ~156 x 156mm (Option : ~12inch, ~210 x 210mm)
Measuring range
- Res : 1m~200 ohm-cm - Rs : 10m ~ 3000 ohm/sq
* The range is separated from each Low, Middle, High/S-High probe type
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비접촉식 면저항측정기
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