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Semi Auto Type
Full Auto Type
Handy type
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Manual Type
Semi Auto Type
Full Auto Type
In-line Type
Handy type
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Semi Auto Type
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Inline Non-contact Res., PN, thickness and lifetime measurement
NC-100PV
- Res : 0.1~15 ¥Ø•cm
- Rs : 5~750 ¥Ø/sq
- Thickness : 100~500 ¥ìm
- Applications : Silicon wafer (Mono-crystalline, Poly-crystalline)
- Wafer sizes : 126, 156, 210mmSQ (PSQ)



- In-line on-the-fly measurement module for solar silicon wafer

- Possilble to measure Resistivity and/or Thickness by each module without contact


- Lifetime measurement module (option) 

- PN type checker module (option)