접촉식 면저항측정기
Manual Type
Semi Auto Type
Full Auto Type
Handy type
비접촉식 면저항측정기
Manual Type
Semi Auto Type
Full Auto Type
In-line Type
Handy type
캐리어 라이프타임측정기
웨이퍼 Flatness / Resistivity
PN판정기
웨이퍼 두께측정기
Manual Type
Semi Auto Type
프로브헤드
확산저항측정기(SRP)
이미지센서 CIS 테스터
표준샘플
장비통합솔루션(측정모듈)
접촉식 면저항
비접촉식 면저항
PN판정
제품별 제품별
Manual Rs/Res. measurement instrument
EC-80
- Rs : 0.01~3000Ω/□
- Res : 0.001~200Ω·cm
- Applications : Silicon wafer, GaAs Epi, GaN, GaP, ITO and metal layers
- Size : 2"~8", or Max. 156mmSQ


- Easy operation and compact design

- Auto-measurement start by inserting a wafer under the sensor

- Easy mode change of resistivity and sheet resistance measurement

- Easy set up to measurement condition by JOG dial

- 5 types of model for each measuring range

- Res : Low – 0.001~0.05 Ω·cm                Rs : Low – 0.01~0.5 Ω/sq
          Middle – 0.05~0.5 Ω·cm                         Middle – 0.5~10 Ω/sq
          High – 0.5~60 Ω·cm                               High – 10~1000 Ω/sq
          Super High – 60~200 Ω·cm                    Super High – 1000~3000 Ω/sq
         
Solar Wafer – 0.2~15 Ω·cm                    Solar - 5~500 Ω/sq