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Semi-auto Rs/Res. measurement system
RT-3000/RG-100
- Rs : 1m~10M¥Ø/sq or 10m~1G¥Ø/sq
- Res : 1¥ì~1M¥Ø¡¤cm
- Applications : Silicon wafer, conductive layer on glass/film and more
- Size : 150x150mm ~ 500x500mm


- Designed for various solar cell substrate samples multi-point measurement

- Tester self-test, thickness, edge, Temperature correction function and
   wide measuring range


- User programmable test pattern both Circle and Square shape


- 2-D/3-D Mapping software(Option)