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Semi Auto Type
Full Auto Type
Handy type
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Manual Type
Semi Auto Type
Full Auto Type
In-line Type
Handy type
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Semi-auto Rs/Res. measurement
NC-80MAP
- Rs : 0.1~3000¥Ø/sq  (Option:1m~1¥Ø/sq)
- Res : 0.001~200¥Ø•cm
- Applications : Silicon wafer, GaAs Epi, GaN, GaP, InP, ITO and metal layers
- Size : 2¡±~8"¬¶



- Resistivity 1probe version (NC-80M)


- Resistivity and thickness probe version (NC-80MAP+TH or NC-80M+TH)


- Fully automatic system version (NC-600MAP)




*Measurement video*
https://www.youtube.com/watch?feature=player_embedded&v=lP16RS25NH8