::냅슨코리아(주)::

접촉식 면저항측정기

비접촉식 면저항측정기

캐리어 라이프타임측정기

웨이퍼 두께측정기

프로브헤드

확산저항측정기(SRP)

이미지센서 CIS 테스터

웨이퍼 두께측정기

제품별 > 웨이퍼 두께측정기


	Wafer 두께측정기 (Semi Auto Type)
	FLA-200
	-Thickness : 200 –1200μm / Bow : +/-350μm / Warp : 350μm - Applications : Semiconductor materilas, Solar-cell materials (Silicon, Polysilicon, SiC etc) Silicon-related epitaxial materials, Ion-implantation sample Chemical compound semiconductor (GaAs Epi, GaN Epi, InP, Ga etc) - Sample sizes : 3~8 inch
	- Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance) - Measures all materials including Si, GaAs, Ge, InP, SiC - Full 500 micron thickness measurement range without re-calibration - 2-D /3-D Mapping software