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Semi-auto Rs/Res. measurement system
RG-100PV
- Rs : 1m~1000k ¥Ø/sq (option : ~10M ¥Ø/sq)
- Res : 1m~200 ¥Ø•cm
- Applications : Silicon wafer, conductive layer on glass/film and more
- Sample sizes : Up to 300mmSQ (opton : 500mmSQ)


- Semi-auto 4 point probe system for solar cell, thinfilm on substrate samples multi-point measurement

- Even pitch and random pitch for Max.1000points

- 2-D/3-D squre mapping software for even pitch

- 2-D pseude squre mapping software (option)