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Napson Corporation 제조사별 > Napson Corporation
Ingot lifetime tester
HF-100DC
- Measuring range : 50μS~20mS
- Applications : Silicon ingot, Silicon bulk, Prismatic shape (JIS c...
Wafer 두께측정기 (Semi Auto Type)
FLA-200
-Thickness : 200 –1200μm / Bow : +/-350μm / Warp : 350μm
- Applications : Semiconductor ma...
Non-contact Ultra-High range Rs measurement s...
CRN-100
- Rs : 10E+9 ~ 10E+15 Ω/sq
- Applications : Any sample within the measurement range can be measur...
Non-Contact (Pulse-Voltage excitation method)...
PVE-80
- Rs : 50u~1mΩ/sq
- Applications : Metal films (Ag , Cu , Au , Al or others)
- Size : ~W300 x D2...

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