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 제조사별 |
 제조사별 |
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Ingot lifetime tester |
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HF-100DC |
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- Measuring range : 50μS~20mS
- Applications : Silicon ingot, Silicon bulk, Prismatic shape (JIS code)
- Sample sizes : Contact us in details |
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 - Contact type lifetime measurement system for silicon ingots/bulks
- Photoconductive decay method (JIS direct current anodizing method)
- Global standard model for the lifetime test of silicon bulk
- Data processing by digital oscilloscope and PC (dedicated software)
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