Napson Corporation
Jandel Engineering Limited
MTI Instruments
Jova Solutions
제조사별 제조사별
Semi-auto Rs/Res. measurement instrument
NC-80MAP
- Rs : 0.1~3000Ω/sq  (Option:1m~1Ω/sq)
- Res : 0.001~200Ω•cm
- Applications : Silicon wafer, GaAs Epi, GaN, GaP, InP, ITO and metal layers
- Size : 2”~8"Ф



- Non-contact muti-points sheet resistance measuring instrument

- Possible to measure wide range of sheet resistance b installing Max. 4 probes

- Min.6mm position from edge can be measured

- Mapping patterns : Up to 217 points map

- Resistivity 1probe version (NC-80M)

- Resistivity and thickness probe version (NC-80MAP+TH or NC-80M+TH)

- Fully automatic system version (NC-600MAP)