Napson Corporation
Jandel Engineering Limited
MTI Instruments
Jova Solutions
제조사별 제조사별
Full Auto 4 point probe system
RT-3000/RG-1200E
- Rs : RT-3000/S ver. 1mΩ/sq∼10MΩ/sq
          RT-3000/H ver. 10mΩ/sq∼1GΩ/sq
          (option : up to 10TΩ/sq)
- Applications : Conductive layer on glass
                        TFT, EL(OLED), CF, Metal thin film, n+a-Si layer, Solar cell
- Glass sizes : Max. 1500mm X 1850mm



- X axis probing and Y axis glass stage moving mechanism

- Tester self-test function, Measurement position correction function and
   wide measurement range

- 0.1 mm measurement position resolution and programmable test pattern

- Optional CIM communication and 2-D/3-D Mapping software

- Compatible with Loading robot for fully automatic measurement (Option)