Napson Corporation
Jandel Engineering Limited
MTI Instruments
Jova Solutions
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Manual Rs/Res. measurement system
RT-70V/RG-7
- Rs:5.0m¥Ø/sq~10.0M¥Ø/sq
- Res:1.0¥ì~300.0k¥Ø•cm ( t=0.01~9999.99¥ìm )
          0.5m¥Ø•cm~1.0M¥Ø•cm ( t > 9999.99¥ìm )
- Applications : Silicon wafer, conductive layer on glass/film and more
- Sample sizes : up to 8"¦ (option : ~12"¦)



- Stage(RG-7): Electric probe up-down stroke

- Thickness input with easy JOG dial operation
  (RT-70V Tester)


- Tester self-test function/Auto change-over measurement range function

- 4 types measuring mode for each sample types

- Temperature correction for silicon resistivity measurement