Napson Corporation
Jandel Engineering Limited
MTI Instruments
Jova Solutions
제조사별 제조사별
Manual Rs/Res. measurement system
RT-70V/RG-7
- Rs:5.0mΩ/sq~10.0MΩ/sq
- Res:1.0μ~300.0kΩ•cm ( t=0.01~9999.99μm )
          0.5mΩ•cm~1.0MΩ•cm ( t > 9999.99μm )
- Applications : Silicon wafer, conductive layer on glass/film and more
- Sample sizes : up to 8"Ф (option : ~12"Ф)



- Stage(RG-7): Electric probe up-down stroke

- Thickness input with easy JOG dial operation
  (RT-70V Tester)

- Tester self-test function/Auto change-over measurement range function

- 4 types measuring mode for each sample types

- Temperature correction for silicon resistivity measurement