Napson Corporation
Jandel Engineering Limited
MTI Instruments
Jova Solutions
제조사별 제조사별
Hand held Rs/Res. measurement system
RT-70V/TS-7D
- Rs:5.0mΩ/sq~10.0MΩ/sq
- Res:1.0μ~300.0kΩ·cm ( t=0.01~9999.99μm )
          0.5mΩ·cm~1.0MΩ·cm ( t > 9999.99μm )
- Applications : Silicon wafer, ingot, conductive layer on glass/film and more
- Sample sizes : Any kinds of sizes (more than 10 mm)


       * Measuring Stage is not attached

- Auto-measurement start by four point probe contacting to sample

- Easy contact to any kinds of sample

- Thickness input with easy JOG dial operation (RT-70V Tester)

- Tester self-test function/Auto change-over measurement range function

- 4 types measuring mode for each sample types

- Temperature correction for silicon resistivity measurement