Napson Corporation
Jandel Engineering Limited
MTI Instruments
Jova Solutions
Á¦Á¶»çº° Á¦Á¶»çº°
PN type checker for wide res. sample
PN-12¥á(PN-12¥â)
- Range :1m~20k¥Ø¡¤cm
- Applications : Silicon wafer, Silicon ingot, bulk and so on
- Sizes : Any kinds of sizes


- Principle : Contact thermo-electromotive force method (seebek effect)

- Thermo electrode and cold electrode is mounted detecting part of
  measuring probes


- Possible to check most figure of sample such as Silicon wafer, Bulk,
  Ingot and so on
  (Oxidized film on wafer surface is not available)


- Thermometer and analogue trimmer (meter) in measurement unit

- PN-12¥â: Built-in module with vacuum contact on measuring stage