Napson Corporation
Jandel Engineering Limited
MTI Instruments
Jova Solutions
제조사별 제조사별
Noncontact PN type checker
PN-50α
- Range : 0.1~1kΩ·cm
- Applications : Silicon wafer (Lapped, Etched, Polished, Mirror, Bulk)
- Sample sizes : 50~300mmФ


- Principle : Photovoltaic effect by light pulse irradiation

- No damage and no stain by Non-contact method

- Possible to check even oxidized film on wafer surface

- Instantly discrimination by optical pulse illuminate