::냅슨코리아(주)::

제조사별


	Wafer lifetime tester
	HF-300
	- Measuring range : 0.1μS-1000μS (*Compatioble to resistivity range : 0.1~1000Ω•cm) - Applications : Silicon wafer, brick (bulk) - Sample sizes : Wafer - [Square] ~210mmSQ [Circle] ~200mm Brick - Max. 210(W) x 500(D) x 210(H) mm
	- Non-contact, non-damage lifetime measurement by μ-PCD - Suitable for mono-crystalline and poly-crystalline silicon wafer - Passivation waith exclusive capsule (for wafer sample) - [Laser unit] - Type : Semiconductor laser diode - Wave length : 905nm (for wafer) / 1000nm (for brick) - Peak power : 60W - Pulse width : 80nS - Resistivity measurement [4PP or N] (option)