Napson Corporation
Jandel Engineering Limited
MTI Instruments
Jova Solutions
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Full Auto wafer sorting system
NC-6800£Í
- Res : 0.001¡­60¥Ø¡¤cm
- Thickness : 150¡­800¥ìm
- PN : 0.1~1000¥Ø¡¤cm in resistivity
- Applications : Silicon wafer, GaP, nd InP
- Wafer sizes : 3"~5"¦ (square samples are available)



- High precision and high speed wafer resistivity measuring system with non-contact eddy current probes

- Max. 300 pieces of wafer are stackable (with non-cassette) on loader and automatically loading to measuring position wih electric static absortion