Napson Corporation
Jandel Engineering Limited
MTI Instruments
Jova Solutions
제조사별 제조사별
Full Auto wafer sorting system
NC-6800M
- Res : 0.001∼60Ω·cm
- Thickness : 150∼800μm
- PN : 0.1~1000Ω·cm in resistivity
- Applications : Silicon wafer, GaP, nd InP
- Wafer sizes : 3"~5"Ф (square samples are available)



- High precision and high speed wafer resistivity measuring system with non-contact eddy current probes

- Max. 300 pieces of wafer are stackable (with non-cassette) on loader and automatically loading to measuring position wih electric static absortion