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 제조사별 |
 제조사별 |
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Manual Rs/Res. measurement system |
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RT-70V/RG-5 |
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- Rs:5.0m~10.0MΩ/sq
- Res:1.0μ~300.0k Ω•cm ( t=0.01~9999.99μm )
0.5m~1.0M Ω•cm ( t > 9999.99μm )
- Applications : Silicon wafer, conductive layer on glass/film and more
- Sample sizes : up to 8"Ф (option : ~12"Ф) |
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 - Stage (RG-5) : Manual probe up-down stroke by handle lever
- Thickness input with easy JOG dial operation
(RT-70V Tester)
- Tester self-test function/Auto change-over measurement range function
- 4 types measuring mode for each sample types
- Temperature correction for silicon resistivity measurement
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